Alexander C.Y. Wei

City:

Poughkeepsie, New York

Country:

United States

Published Applications:

Last publication date:

2007-07-26

Recent patent applications by Wei Alexander C.Y.

Alexander C.Y. Wei from Poughkeepsie, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2007-07-26

US20070174012A1

Physics

Method Of Determining Photomask Inspection Capabilities

InventorID:

4459448 ⎘