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Inventor profile of:

Junichi Tanaka

City:

Tokyo

Country:

Japan

Published Applications:

30

Last publication date:

2026-06-04

Top Assignees for applications by Junichi Tanaka

The entities that hold a legal rights for patent applications filed by inventor Tanaka Junichi:

Recent patent applications by Tanaka Junichi

Junichi Tanaka from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-06-04
US20260154838A1
Physics

Structure Estimation System and Structure Estimation Program for Estimating Height of Structure Based on Data from Charged Particle Beam Device

 #2 | 2024-09-12
US20240303947A1
Physics

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING TERMINAL, INFORMATION PROCESSING METHOD, AND PROGRAM

 #3 | 2024-08-01
US20240259518A1
Electricity

INFORMATION PROCESSING DEVICE, VIDEO PROCESSING METHOD, AND PROGRAM

 #4 | 2024-04-04
US20240114181A1
Electricity

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM

 #5 | 2023-06-08
US20230177787A1
Physics

Information processing device, information processing system, and program

 #6 | 2022-04-28
US20220130027A1
Physics

Structure Estimation System and Structure Estimation Program

 #7 | 2022-02-03
US20220032455A1
Performing operations; transporting

ESTIMATION APPARATUS, ESTIMATION METHOD, AND ESTIMATION PROGRAM

 #8 | 2021-02-11
US20210043419A1
Electricity

Charged particle beam apparatus and charged particle beam inspection system

 #9 | 2020-10-15
US20200328101A1
Electricity

SEARCH APPARATUS AND SEARCH METHOD

 #10 | 2018-04-05
US20180095454A1
Physics

PRE-PROCESSOR AND DIAGNOSIS DEVICE

 #11 | 2018-03-22
US20180082873A1
Electricity

Search apparatus and search method

 #12 | 2017-07-27
US20170213695A1
Electricity

Charged particle beam device, simulation method, and simulation device

 #13 | 2017-05-18
US20170142413A1
Electricity

Image processing device and method

 #14 | 2016-12-22
US20160371137A1
Physics

Preprocessor of abnormality sign diagnosing device and processing method of the same

 #15 | 2016-04-28
US20160119644A1
Electricity

Image processing apparatus and image processing method

 #16 | 2016-03-17
US20160079055A1
Electricity

SAMPLE CLEANING APPARATUS AND SAMPLE CLEANING METHOD

 #17 | 2015-04-23
US20150110406A1
Physics

Measurement method, image processing device, and charged particle beam apparatus

 #18 | 2015-02-05
US20150036914A1
Physics

Method for estimating shape before shrink and CD-SEM apparatus

 #19 | 2014-09-04
US20140246585A1
Electricity

Measuring method, data processing apparatus and electron microscope using same

 #20 | 2013-09-19
US20130247110A1
Electricity

Image processing apparatus and image processing method

 #21 | 2010-05-27
US20100127974A1
Physics

DATA INSPECTING DEVICE AND METHOD

 #22 | 2009-06-18
US20090152241A1
Electricity

PLASMA ETCHING APPARATUS AND PLASMA ETCHING METHOD

 #23 | 2008-05-15
US20080110569A1
Electricity

PLASMA ETCHING APPARATUS AND PLASMA ETCHING METHOD

 #24 | 2008-02-07
US20080029464A1
Human necessities

Audio Rack

 #25 | 2007-03-29
US20070070338A1
Physics

Method and device for examination of nonuniformity defects of patterns

 #26 | 2007-03-15
US20070056929A1
Electricity

Plasma etching apparatus and plasma etching method

 #27 | 2006-08-31
US20060191482A1
Electricity

Apparatus and method for processing wafer

 #28 | 2006-08-03
US20060169671A1
Electricity

Plasma etching apparatus and plasma etching method

 #29 | 2005-12-29
US20050284574A1
Electricity

Plasma processing apparatus and processing method

 #30 | 2005-09-01
US20050189070A1
Electricity

Plasma processing apparatus and processing method
InventorID:

448960 ⎘