Wayne Chen

City:

Palo Alto, California

Country:

United States

Published Applications:

Last publication date:

2007-09-27

Top Assignees for applications by Wayne Chen

The entities that hold a legal rights for patent applications filed by inventor Chen Wayne:

Wayne Chen from Palo Alto, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Method and system for inspecting surfaces with improved light efficiency

System and methods for classifying anomalies of sample surfaces

System and methods for classifying anomalies of sample surfaces

System and methods for classifying anomalies of sample surfaces

InventorID:

4493584 ⎘