Markus Lankers

City:

Berlin

Country:

Germany

Published Applications:

Last publication date:

2007-10-04

Top Assignees for applications by Markus Lankers

The entities that hold a legal rights for patent applications filed by inventor Lankers Markus:

Markus Lankers from Berlin, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method of and apparatus for measuring layer thicknesses and layer homogeneities in containers

Methods of using and fabricating a supporting substrate for the deposition, automated recognition, and spectroscopic identification of particles

InventorID:

4498015 ⎘