Jena
Germany
11
2025-05-15
The entities that hold a legal rights for patent applications filed by inventor Seidel Dirk:
Dirk Seidel from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
WIDE-FIELD SWEPT-SOURCE OCT AND METHOD FOR MOVING OBJECTS
#2 | 2024-04-25METHOD FOR DETERMINING THE PHASE AND/OR REFRACTIVE INDEX OF A REGION OF AN OBJECT, AND MICROSCOPE FOR DETERMINING THE PHASE AND/OR REFRACTIVE INDEX OF A REGION OF AN OBJECT
#3 | 2024-01-25Measurement Techniques for Correcting Images with Extended Depth of Field
#4 | 2019-01-24Method for correcting the distortion of a first imaging optical unit of a first measurement system
#5 | 2017-04-27Method for localizing defects on substrates
#6 | 2016-04-14Method and device for determining a lateral offset of a pattern on a substrate relative to a desired position
#7 | 2015-12-03Method for ascertaining distortion properties of an optical system in a measurement system for microlithography
#8 | 2013-03-14Grating-assisted autofocus device and autofocusing method for an imaging device
#9 | 2013-01-17Method and apparatus for the position determination of structures on a mask for microlithography
#10 | 2012-05-17Determination of the relative position of two structures
#11 | 2012-03-15Method for determining the registration of a structure on a photomask and apparatus to perform the method
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