Patrick S. Rood

City:

Walker, Michigan

Country:

United States

Published Applications:

Last publication date:

2007-12-20

Top Assignees for applications by Patrick S. Rood

The entities that hold a legal rights for patent applications filed by inventor Rood Patrick S.:

Patrick S. Rood from Walker, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Measuring an appearance property of a surface using a bidirectional reflectance distribution function

Measuring an appearance property of a surface using a spatially under-sampled bidirectional reflectance distribution function

InventorID:

4537940 ⎘