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Inventor profile of:

Keisuke Iwata

City:

Tokyo

Country:

Japan

Published Applications:

1

Last publication date:

2007-12-27

Recent patent applications by Iwata Keisuke

Keisuke Iwata from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2007-12-27

US20070298519A1

Method of Measuring Affinity Substances

InventorID:

4542265 ⎘