Fremont, California
United States
2
2006-02-23
The entities that hold a legal rights for patent applications filed by inventor Tu Wayne:
Wayne Tu from Fremont, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Method and apparatus for nitride spacer etch process implementing in situ interferometry endpoint detection and non-interferometry endpoint monitoring
#2 | 2005-12-20Method and apparatus for nitride spacer etch process implementing in situ interferometry endpoint detection and non-interferometry endpoint monitoring
4576991 ⎘