Robert Lee Ayers

City:

Durham, North Carolina

Country:

United States

Published Applications:

Last publication date:

2006-07-13

Top Assignees for applications by Robert Lee Ayers

The entities that hold a legal rights for patent applications filed by inventor Ayers Robert Lee:

Robert Lee Ayers from Durham, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Boundary scan apparatus and interconnect test method

InventorID:

4665483 ⎘