Patrick Sprinkle

City:

Portland, Oregon

Country:

United States

Published Applications:

Last publication date:

2006-08-24

Recent patent applications by Sprinkle Patrick

Patrick Sprinkle from Portland, US has applied for patents for these inventions. The list has both pending applications and granted patents:

In-situ wafer parameter measurement method employing a hot susceptor as radiation source for reflectance measurement

InventorID:

4689839 ⎘