Deepak Ranjan Sahoo

City:

Ames, Iowa

Country:

United States

Published Applications:

Last publication date:

2006-11-16

Top Assignees for applications by Deepak Ranjan Sahoo

The entities that hold a legal rights for patent applications filed by inventor Sahoo Deepak Ranjan:

Deepak Ranjan Sahoo from Ames, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Method to transiently detect sample features using cantilevers

Real time detection of loss of cantilever sensing loss

Method to transiently detect samples in atomic force microscopes

InventorID:

4705287 ⎘