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Inventor profile of:

Michal Eilon

City:

Beit Elazari

Country:

Israel

Published Applications:

Last publication date:

2026-04-16

Top Assignees for applications by Michal Eilon

The entities that hold a legal rights for patent applications filed by inventor Eilon Michal:

APPLIED MATERIALS ISRAEL, LTD 12 Rehovot, Israel

Recent patent applications by Eilon Michal

Michal Eilon from Beit Elazari, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-04-16

US20260104373A1

Physics

MATERIAL CHARACTERIZATION USING GREY LEVEL MEASUREMENT AND X-RAY CHARACTERIZATION

#2 | 2025-07-17

US20250231132A1

Physics

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VIA X-RAY MODELLING BASED ON GROUND TRUTH MEASUREMENTS

#3 | 2025-07-03

US20250216347A1

Physics

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VIA X-RAY MODELLING BASED ON SIMULATIONS AND GROUND TRUTH MEASUREMENTS

#4 | 2025-04-24

US20250130185A1

Physics

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF SPECIMENS

#5 | 2024-08-01

US20240255449A1

Physics

NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATURE MEASUREMENTS

#6 | 2024-03-21

US20240096591A1

Electricity

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

#7 | 2024-03-21

US20240094150A1

Physics

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

#8 | 2024-03-14

US20240085356A1

Physics

Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS

#9 | 2024-03-14

US20240085351A1

Physics

DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS

#10 | 2020-01-09

US20200013603A1

Electricity

Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber

#11 | 2019-01-24

US20190027354A1

Electricity

Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber

#12 | 2006-09-28

US20060216839A1

Electricity

Method for monitoring chamber cleanliness

InventorID:

4707695 ⎘