Hirohiko Endoh

City:

Osaka

Country:

Japan

Published Applications:

Last publication date:

2006-11-23

Top Assignees for applications by Hirohiko Endoh

The entities that hold a legal rights for patent applications filed by inventor Endoh Hirohiko:

Hirohiko Endoh from Osaka, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Silicon substrate processing method for observing defects in semiconductor devices and defect-detecting method

InventorID:

4738809 ⎘