Inventor profile of:

Thomas J. Sonderman

City:

Austin, Texas

Country:

United States

Published Applications:

15

Last publication date:

2013-12-24

Top Assignees for applications by Thomas J. Sonderman

The entities that hold a legal rights for patent applications filed by inventor Sonderman Thomas J.:

Recent patent applications by Sonderman Thomas J.

Thomas J. Sonderman from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2013-12-24
US10932989
-

Process control using analysis of an upstream process

#2 | 2013-01-22
US10323272
-

Parallel fault detection

#3 | 2011-09-13
US10323530
-

Dynamic adaptive sampling rate for model prediction

#4 | 2008-07-22
US10209585
-

Plasma state monitoring to control etching processes and across-wafer uniformity, and system for performing same

#5 | 2007-11-06
US11342759
-

Total tool control for semiconductor manufacturing

#6 | 2007-08-07
US10301051
-

Secondary process controller for supplementing a primary process controller

#7 | 2006-10-03
US10323553
-

Determining transmission of error effects for improving parametric performance

#8 | 2006-09-05
US9824301
-

Method and apparatus for initializing tool controllers based on tool event data

#9 | 2005-11-29
US9838467
-

Method and apparatus for updating control state variables of a process control model based on rework data

#10 | 2005-11-01
US10126172
-

Method and apparatus for dynamically monitoring controller tuning parameters

#11 | 2005-08-30
US9789872
-

Method and apparatus for controlling process target values based on manufacturing metrics

#12 | 2005-08-02
US10223174
-

Process control based on an estimated process result

#13 | 2005-07-12
US10323543
-

Method and apparatus for predicting electrical parameters using measured and predicted fabrication parameters

#14 | 2005-05-31
US9824348
-

Method and apparatus for distinguishing between sources of process variation

#15 | 2005-01-13
US20050009217A1
Electricity

Methods of controlling properties and characteristics of a gate insulation layer based upon electrical test data, and system for performing same

InventorID:

4766091 ⎘