Williston, Vermont
United States
24
2016-11-17
The entities that hold a legal rights for patent applications filed by inventor Lamorey Mark C. H.:
Mark C. H. Lamorey from Williston, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Suggesting adjustments to a helmet based on analysis of play
#2 | 2016-11-17MONITORING IMPACTS BETWEEN INDIVIDUALS FOR CONCUSSION ANALYSIS
#3 | 2016-11-17MONITORING IMPACTS BETWEEN INDIVIDUALS FOR CONCUSSION ANALYSIS
#4 | 2016-11-17HELMET HAVING AN EMBEDDED COOLING ARRAY
#5 | 2016-11-17HELMET HAVING AN EMBEDDED COOLING ARRAY
#6 | 2016-11-17Mouthguard for analysis of biomarkers for traumatic brain injury
#7 | 2016-11-17DETECTION OF A TRAUMATIC BRAIN INJURY WITH A MOBILE DEVICE
#8 | 2016-11-17Helmet having a cumulative concussion indicator
#9 | 2016-11-17Automatic adjustment of helmet parameters based on a category of play
#10 | 2016-11-17Helmet having a cumulative concussion indicator
#11 | 2016-11-17Suggesting adjustments to a helmet based on analysis of play
#12 | 2016-11-17Mouthguard for analysis of biomarkers for traumatic brain injury
#13 | 2016-11-17DETECTION OF A TRAUMATIC BRAIN INJURY WITH A MOBILE DEVICE
#14 | 2016-11-17Automatic adjustment of helmet parameters based on a category of play
#15 | 2016-09-29Monitoring a person for indications of a brain injury
#16 | 2016-09-29Monitoring a person for indications of a brain injury
#17 | 2016-09-29Monitoring a person for indications of a brain injury
#18 | 2016-09-29Monitoring a person for indications of a brain injury
#19 | 2016-09-29Monitoring a person for indications of a brain injury
#20 | 2016-09-29MONITORING A PERSON FOR INDICATIONS OF A BRAIN INJURY
#21 | 2016-08-04Normally closed microelectromechanical switches (MEMS), methods of manufacture and design structures
#22 | 2015-09-03Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures
#23 | 2014-07-24Land grid array (LGA) socket cartridge and method of forming
#24 | 2013-10-17Semiconductor test and monitoring structure to detect boundaries of safe effective modulus
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