Inventor profile of:

Dechao Guo

City:

Fishkill, New York

Country:

United States

Published Applications:

80

Last publication date:

2016-04-07

Top Assignees for applications by Dechao Guo

The entities that hold a legal rights for patent applications filed by inventor Guo Dechao:

Recent patent applications by Guo Dechao

Dechao Guo from Fishkill, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2016-04-07
US20160099332A1
Electricity

Partial sacrificial dummy gate with CMOS device with high-k metal gate

#2 | 2015-08-20
US20150235903A1
Electricity

Self-Aligned III-V MOSFET Fabrication With In-Situ III-V Epitaxy And In-Situ Metal Epitaxy and Contact Formation

#3 | 2015-08-13
US20150228753A1
Electricity

Self aligned embedded gate carbon transistors

#4 | 2015-07-09
US20150194484A1
Electricity

Fabricating shallow-trench isolation semiconductor devices to reduce or eliminate oxygen diffusion

#5 | 2015-07-09
US20150194334A1
Electricity

Fabricating shallow-trench isolation semiconductor devices to reduce or eliminate oxygen diffusion

#6 | 2015-07-02
US20150187897A1
Electricity

Partial sacrificial dummy gate with CMOS device with high-k metal gate

#7 | 2015-07-02
US20150187764A1
Electricity

STACKED CARBON-BASED FETS

#8 | 2015-04-30
US20150115365A1
Electricity

CONTINUOUSLY SCALABLE WIDTH AND HEIGHT SEMICONDUCTOR FINS

#9 | 2015-04-16
US20150102453A1
Electricity

Fabricating shallow-trench isolation semiconductor devices to reduce or eliminate oxygen diffusion

#10 | 2015-03-26
US20150084096A1
Electricity

Faceted intrinsic epitaxial buffer layer for reducing short channel effects while maximizing channel stress levels

#11 | 2015-03-12
US20150072481A1
Electricity

Semiconductor-on-insulator device including stand-alone well implant to provide junction butting

#12 | 2015-03-12
US20150069513A1
Electricity

Semiconductor-on-insulator device including stand-alone well implant to provide junction butting

#13 | 2015-03-05
US20150060770A1
Electricity

Light emitting diode (LED) using carbon materials

#14 | 2014-12-25
US20140377924A1
Electricity

Strained finFET with an electrically isolated channel

#15 | 2014-11-13
US20140332862A1
Electricity

Stacked carbon-based FETs

#16 | 2014-11-13
US20140332860A1
Electricity

Stacked carbon-based FETs

#17 | 2014-10-23
US20140312413A1
Electricity

Self aligned embedded gate carbon transistors

#18 | 2014-10-23
US20140312412A1
Electricity

Self aligned embedded gate carbon transistors

#19 | 2014-09-18
US20140264591A1
Electricity

Method and structure for dielectric isolation in a fin field effect transistor

#20 | 2014-09-18
US20140264558A1
Electricity

Faceted intrinsic epitaxial buffer layer for reducing short channel effects while maximizing channel stress levels

#21 | 2014-09-18
US20140264444A1
Electricity

STRESS-ENHANCING SELECTIVE EPITAXIAL DEPOSITION OF EMBEDDED SOURCE AND DRAIN REGIONS

#22 | 2014-09-04
US20140246727A1
Electricity

Work function adjustment by carbon implant in semiconductor devices including gate structure

#23 | 2014-08-07
US20140217481A1
Electricity

Partial sacrificial dummy gate with CMOS device with high-k metal gate

#24 | 2014-07-24
US20140203363A1
Electricity

Extremely Thin Semiconductor-On-Insulator Field-Effect Transistor With An Epitaxial Source And Drain Having A Low External Resistance

#25 | 2014-07-24
US20140203361A1
Electricity

EXTREMELY THIN SEMICONDUCTOR-ON-INSULATOR FIELD-EFFECT TRANSISTOR WITH AN EPITAXIAL SOURCE AND DRAIN HAVING A LOW EXTERNAL RESISTANCE

#26 | 2014-07-10
US20140191297A1
Electricity

Strained finFET with an electrically isolated channel

#27 | 2014-06-05
US20140154851A1
Electricity

Non-volatile graphene nanomechanical switch

#28 | 2014-06-05
US20140151786A1
Electricity

Non-volatile graphene nanomechanical switch

#29 | 2014-05-15
US20140131802A1
Electricity

Structure and method to form passive devices in ETSOI process flow

#30 | 2014-05-08
US20140124861A1
Electricity

Transistors with uniaxial stress channels

#31 | 2014-03-06
US20140065807A1
Electricity

Partially-blocked well implant to improve diode ideality with SiGe anode

#32 | 2014-03-06
US20140061857A1
Electricity

Partially-blocked well implant to improve diode ideality with SiGe anode

#33 | 2014-02-13
US20140042561A1
Electricity

Replacement gate electrode with planar work function material layers

#34 | 2013-12-19
US20130334602A1
Electricity

Continuously scalable width and height semiconductor fins

#35 | 2013-12-12
US20130330899A1
Electricity

PREVENTING FULLY SILICIDED FORMATION IN HIGH-K METAL GATE PROCESSING

#36 | 2013-12-12
US20130328135A1
Electricity

PREVENTING FULLY SILICIDED FORMATION IN HIGH-K METAL GATE PROCESSING

#37 | 2013-11-21
US20130309830A1
Electricity

Self-aligned III-V MOSFET fabrication with in-situ III-V epitaxy and in-situ metal epitaxy and contact formation

#38 | 2013-11-21
US20130307089A1
Electricity

Self-aligned III-V MOSFET fabrication with in-situ III-V epitaxy and in-situ metal epitaxy and contact formation

#39 | 2013-10-31
US20130285156A1
Electricity

FIN FIELD EFFECT TRANSISTOR WITH VARIABLE CHANNEL THICKNESS FOR THRESHOLD VOLTAGE TUNING

#40 | 2013-09-19
US20130244386A1
Electricity

Self-aligned carbon electronics with embedded gate electrode

#41 | 2013-08-15
US20130207194A1
Electricity

Transistors with uniaxial stress channels

#42 | 2013-08-08
US20130200468A1
Electricity

Integration of SMT in replacement gate FINFET process flow

#43 | 2013-07-11
US20130178020A1
Electricity

finFET with fully silicided gate

#44 | 2013-07-11
US20130175642A1
Electricity

Scaling of metal gate with aluminum containing metal layer for threshold voltage shift

#45 | 2013-07-11
US20130175633A1
Electricity

Controlling threshold voltage in carbon based field effect transistors

#46 | 2013-07-11
US20130175632A1
Electricity

REDUCTION OF CONTACT RESISTANCE AND JUNCTION LEAKAGE

#47 | 2013-07-11
US20130175620A1
Electricity

FinFET with fully silicided gate

#48 | 2013-07-04
US20130168834A1
Electricity

III-V compound semiconductor material passivation with crystalline interlayer

#49 | 2013-06-20
US20130154029A1
Electricity

Embedded stressors for multigate transistor devices

#50 | 2013-06-20
US20130154001A1
Electricity

Embedded stressors for multigate transistor devices

#51 | 2013-06-20
US20130153964A1
Electricity

FETs with hybrid channel materials

#52 | 2013-05-23
US20130130446A1
Electricity

Transistor employing vertically stacked self-aligned carbon nanotubes

#53 | 2013-05-23
US20130126830A1
Electricity

Transistor employing vertically stacked self-aligned carbon nanotubes

#54 | 2013-05-09
US20130115732A1
Electricity

Method to fabricate multicrystal solar cell with light trapping surface using nanopore copolymer

#55 | 2013-05-02
US20130105896A1
Electricity

Threshold Voltage Adjustment For Thin Body Mosfets

#56 | 2013-05-02
US20130105894A1
Electricity

Threshold voltage adjustment for thin body MOSFETs

#57 | 2013-04-25
US20130099313A1
Electricity

FinFET structure and method to adjust threshold voltage in a FinFET structure

#58 | 2013-04-18
US20130095623A1
Electricity

Method to fabricate a vertical transistor having an asymmetric gate with two conductive layers having different work functions

#59 | 2013-04-18
US20130093021A1
Electricity

Carbon implant for workfunction adjustment in replacement gate transistor

#60 | 2013-04-18
US20130093018A1
Electricity

Carbon implant for workfunction adjustment in replacement gate transistor

#61 | 2013-04-18
US20130093000A1
Electricity

Vertical transistor having an asymmetric gate

#62 | 2013-04-16
US13348355
-

Controlling threshold voltage in carbon based field effect transistors

#63 | 2013-04-11
US20130087859A1
Electricity

Work function adjustment by carbon implant in semiconductor devices including gate structure

#64 | 2013-04-11
US20130087759A1
Electricity

Light emitting diode (LED) using carbon materials

#65 | 2013-04-04
US20130082348A1
Electricity

Structure and method to form passive devices in ETSOI process flow

#66 | 2013-02-28
US20130048988A1
Electricity

Nanopillar E-fuse structure and process

#67 | 2013-01-31
US20130029488A1
Electricity

Single Liner Process to Achieve Dual Stress

#68 | 2013-01-24
US20130020658A1
Electricity

Replacement gate electrode with planar work function material layers

#69 | 2012-12-27
US20120326228A1
Electricity

Self-aligned carbon electronics with embedded gate electrode

#70 | 2012-12-06
US20120306026A1
Electricity

REPLACEMENT GATE ELECTRODE WITH A TUNGSTEN DIFFUSION BARRIER LAYER

#71 | 2012-11-22
US20120292602A1
Electricity

Self-aligned carbon electronics with embedded gate electrode

#72 | 2012-11-15
US20120286375A1
Electricity

Post-planarization UV curing of stress inducing layers in replacement gate transistor fabrication

#73 | 2012-10-25
US20120268985A1
Electricity

Resonance nanoelectromechanical systems

#74 | 2012-10-11
US20120256294A1
Performing operations; transporting

Nanopillar decoupling capacitor

#75 | 2012-10-04
US20120248509A1
Electricity

Structure and process for metal fill in replacement metal gate integration

#76 | 2012-09-20
US20120235247A1
Electricity

Fin field effect transistor with variable channel thickness for threshold voltage tuning

#77 | 2012-08-30
US20120220114A1
Electricity

Tensile stress enhancement of nitride film for stressed channel field effect transistor fabrication

#78 | 2012-07-26
US20120187505A1
Electricity

Self-aligned III-V MOSFET fabrication with in-situ III-V epitaxy and in-situ metal epitaxy and contact formation

#79 | 2012-05-31
US20120132913A1
Electricity

III-V compound semiconductor material passivation with crystalline interlayer

#80 | 2011-12-27
US12908016
-

Replacement metal gate method

InventorID:

48339 ⎘