Oliver Broermann

City:

Dresden

Country:

Germany

Published Applications:

Last publication date:

2005-12-27

Top Assignees for applications by Oliver Broermann

The entities that hold a legal rights for patent applications filed by inventor Broermann Oliver:

Oliver Broermann from Dresden, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for measuring a characteristic dimension of at least one pattern on a disc-shaped object in a measuring instrument

Measuring configuration and method for measuring a critical dimension of at least one feature on a semiconductor wafer

Lithographic mask, and method for covering a mask layer

InventorID:

4844350 ⎘