James W. Overbeck

City:

Hingham, Massachusetts

Country:

United States

Published Applications:

Last publication date:

2007-12-25

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The entities that hold a legal rights for patent applications filed by inventor Overbeck James W.:

James W. Overbeck from Hingham, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Wide field of view and high speed scanning microscopy

Scanning microscopy, fluorescence detection, and laser beam positioning

Focusing of microscopes and reading of microarrays

Laser system for vision correction

Depositing fluid specimens on substrates, resulting ordered arrays, techniques for analysis of deposited arrays

InventorID:

4938495 ⎘