🔗 Permalink

Inventor profile of:

Tetsuya Watanabe

City:

Honjyo

Country:

Japan

Published Applications:

1

Last publication date:

2005-12-01

Recent patent applications by Watanabe Tetsuya

Tetsuya Watanabe from Honjyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2005-12-01

US20050264797A1

Method and apparatus for detecting defects

InventorID:

4951843 ⎘