Amit Nahar

City:

Allen, Texas

Country:

United States

Published Applications:

Last publication date:

2021-06-17

Top Assignees for applications by Amit Nahar

The entities that hold a legal rights for patent applications filed by inventor Nahar Amit:

Amit Nahar from Allen, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Fail Density-Based Clustering for Yield Loss Detection

Integrated circuit manufacture and outlier detection

InventorID:

5017122 ⎘