Beijing
China
6
2026-01-15
The entities that hold a legal rights for patent applications filed by inventor MENG Qinglang:
Qinglang MENG from Beijing, CN has applied for patents for these inventions. The list has both pending applications and granted patents:
APPARATUS FOR DETECTING ELECTRON, METHOD FOR DETECTING ELECTRON SIGNAL, AND ELECTRON MICROSCOPE
#2 | 2023-01-05Scanning electron microscope device and electron beam inspection apparatus
#3 | 2023-01-05Scanning electron microscope device and electron beam inspection apparatus
#4 | 2022-05-19Wien filter and charged particle beam imaging apparatus
#5 | 2021-03-04Wien filter and charged particle beam imaging apparatus
#6 | 2021-03-04Multi-pole deflector for charged particle beam and charged particle beam imaging apparatus
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