Alexander CHERESHNYA

City:

Kfar Saba

Country:

Israel

Published Applications:

Last publication date:

2026-01-15

Top Assignees for applications by Alexander CHERESHNYA

The entities that hold a legal rights for patent applications filed by inventor CHERESHNYA Alexander:

APPLIED MATERIALS ISRAEL, LTD 2 Rehovot, Israel

Recent patent applications by CHERESHNYA Alexander

Alexander CHERESHNYA from Kfar Saba, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-01-15

US20260017940A1

Physics

DEFECT FILTERING FOR MASK INSPECTION

#2 | 2022-08-11

US20220254000A1

Physics

Mask inspection of a semiconductor specimen

#3 | 2021-03-11

US20210073963A1

Physics

Mask inspection of a semiconductor specimen

InventorID:

5025459 ⎘