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Inventor profile of:

Philipp Huethwohl

City:

Ulm

Country:

Germany

Published Applications:

7

Last publication date:

2025-11-27

Top Assignees for applications by Philipp Huethwohl

The entities that hold a legal rights for patent applications filed by inventor Huethwohl Philipp:

  • Carl Zeiss SMT GmbH 1 Oberkochen, Germany

Recent patent applications by Huethwohl Philipp

Philipp Huethwohl from Ulm, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-11-27
US20250362253A1
Physics

3D VOLUME INSPECTION METHOD AND METHOD OF CONFIGURING OF A 3D VOLUME INSPECTION METHOD

#2 | 2024-12-12
US20240411296A1
Physics

COMPUTER IMPLEMENTED METHOD FOR THE DETECTION AND CLASSIFICATION OF ANOMALIES IN AN IMAGING DATASET OF A WAFER, AND SYSTEMS MAKING USE OF SUCH METHODS

#3 | 2024-08-22
US20240281952A1
Physics

3D VOLUME INSPECTION METHOD AND METHOD OF CONFIGURING OF A 3D VOLUME INSPECTION METHOD

#4 | 2023-08-17
US20230260105A1
Physics

DEFECT DETECTION FOR SEMICONDUCTOR STRUCTURES ON A WAFER

#5 | 2022-02-10
US20220044949A1
Electricity

INTERACTIVE AND ITERATIVE TRAINING OF A CLASSIFICATION ALGORITHM FOR CLASSIFYING ANOMALIES IN IMAGING DATASETS

#6 | 2021-09-23
US20210296089A1
Electricity

Method of recording an image using a particle microscope

#7 | 2021-03-11
US20210073976A1
Physics

WAFER INSPECTION METHODS AND SYSTEMS

InventorID:

5025469 ⎘

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