Eindhoven
Netherlands
8
2024-03-21
The entities that hold a legal rights for patent applications filed by inventor Peemen Maurice:
Maurice Peemen from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method
#2 | 2023-02-02Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
#3 | 2022-12-29AREA SELECTION IN CHARGED PARTICLE MICROSCOPE IMAGING
#4 | 2022-12-29Charged particle microscope scan masking for three-dimensional reconstruction
#5 | 2022-09-29Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
#6 | 2022-03-31Depth reconstruction for 3D images of samples in a charged particle system
#7 | 2021-10-21Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method
#8 | 2021-04-08Low keV ion beam image restoration by machine learning for object localization
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