Tomoyuki IWATA

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2021-07-01

Recent patent applications by IWATA Tomoyuki

Tomoyuki IWATA from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2021-07-01

US20210200922A1

Physics

Scattering Measurement Analysis Method, Scattering Measurement Analysis Device, And Non-Transitory Computer-Readable Storage Medium Storing Scattering Measurement Analysis Program

InventorID:

5125237 ⎘