Bernd Irmer

City:

Munich

Country:

Germany

Published Applications:

Last publication date:

2020-10-29

Top Assignees for applications by Bernd Irmer

The entities that hold a legal rights for patent applications filed by inventor Irmer Bernd:

Bernd Irmer from Munich, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for providing a probe device for scanning probe microscopy

Characterization structure for an atomic force microscope tip

Electron beam source and method of manufacturing the same

Electron beam source and method of manufacturing the same

InventorID:

512879 ⎘