Thomas JUFFMANN

City:

Wien

Country:

Austria

Published Applications:

Last publication date:

2021-10-21

Top Assignees for applications by Thomas JUFFMANN

The entities that hold a legal rights for patent applications filed by inventor JUFFMANN Thomas:

Thomas JUFFMANN from Wien, AT has applied for patents for these inventions. The list has both pending applications and granted patents:

HIGH SENSITIVITY PHASE MICROSCOPY IMAGING

Aberration reduction in multipass electron microscopy

InventorID:

5137838 ⎘