David Alan Shier

City:

Lee's Summit, Missouri

Country:

United States

Published Applications:

Last publication date:

2026-05-07

Top Assignees for applications by David Alan Shier

The entities that hold a legal rights for patent applications filed by inventor Shier David Alan:

DIT-MCO INTERNATIONAL LLC 2 Kansas City, MO United States

Recent patent applications by Shier David Alan

David Alan Shier from Lee's Summit, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-05-07

US20260126471A1

Physics

PARTIALLY GUARDED SWITCHING MATRIX FOR AUTOMATIC ELECTRONIC TEST EQUIPMENT

#2 | 2026-05-05

US19381728

Physics

Partailly guarded switching matrix for automatic electronic test equipment

#3 | 2026-02-19

US20260050046A1

Physics

CALIBRATED ELECTRICAL CONTINUITY DETECTOR

#4 | 2025-11-13

US20250347735A1

Physics

SYSTEMS AND METHODS INCLUDING IDENTIFICATION CHIPS IN ADAPTER CABLES

#5 | 2025-04-24

US20250130291A1

Physics

BINARY SCAN SYSTEM FOR LEAKAGE DETECTION IN WIRE HARNESSES

#6 | 2021-08-12

US20210247463A1

Physics

Methods and systems for wire harness test results analysis

InventorID:

5160700 ⎘