Eindhoven
Netherlands
3
2024-01-25
The entities that hold a legal rights for patent applications filed by inventor SPANJER Tjerk Gerrit:
Tjerk Gerrit SPANJER from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
Method, device and system for reducing off-axial aberration in electron microscopy
#2 | 2023-07-13Method, device and system for reducing off-axial aberration in electron microscopy
#3 | 2021-09-02Method, device and system for reducing off-axial aberration in electron microscopy
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