Niskayuna, New York
United States
6
2026-05-21
The entities that hold a legal rights for patent applications filed by inventor Immer Christopher D.:
Christopher D. Immer from Niskayuna, US has applied for patents for these inventions. The list has both pending applications and granted patents:
HIGH RESOLUTION IMAGING CALIBRATION FOR PROCESS MONITORING SYSTEM FOR ADDITIVE MANUFACTURING
#2 | 2026-05-21MULTI-CAMERA HIGH RESOLUTION IMAGING PROCESS MONITORING SYSTEM FOR ADDITIVE MANUFACTURING
#3 | 2026-05-21SCANNER CALIBRATION USING HIGH RESOLUTION IMAGING PROCESS MONITORING SYSTEM FOR ADDITIVE MANUFACTURING
#4 | 2025-02-06SYSTEMS AND METHODS FOR OPTIMIZING METAMATERIAL LATTICES TO REDUCE DISTORTIONS AND STRESS
#5 | 2024-10-17SYSTEMS AND METHODS FOR COMPRESSION, MANAGEMENT, AND ANALYSIS OF DOWNBEAM CAMERA DATA FOR AN ADDITIVE MACHINE
#6 | 2021-09-16Systems and methods for compression, management, and analysis of downbeam camera data for an additive machine
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