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Inventor profile of:

Lior Haim

City:

Eilat

Country:

Israel

Published Applications:

1

Last publication date:

2021-09-16

Recent patent applications by Haim Lior

Lior Haim from Eilat, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2021-09-16

US20210287352A1

Minimally Supervised Automatic-Inspection (AI) of Wafers Supported by Convolutional Neural-Network (CNN) Algorithms

InventorID:

5191305 ⎘