Peter TIEMEIJER

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2025-06-05

Top Assignees for applications by Peter TIEMEIJER

The entities that hold a legal rights for patent applications filed by inventor TIEMEIJER Peter:

Peter TIEMEIJER from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

TRANSMISSION ELECTRON MICROSCOPE WITH VARIABLE EFFECTIVE FOCAL LENGTH

METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE

Dynamic Data Driven Detector Tuning for Improved Investigation of Samples in Charged Particle Systems

System and method for reducing the charging effect in a transmission electron microscope system

Method of imaging a specimen using a transmission charged particle microscope

InventorID:

5285280 ⎘