Inventor profile of:

Da Li

City:

Newark, California

Country:

United States

Published Applications:

25

Last publication date:

2026-03-12

Top Assignees for applications by Da Li

The entities that hold a legal rights for patent applications filed by inventor Li Da:

Recent patent applications by Li Da

Da Li from Newark, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-03-12
US20260072353A1
Physics

CYCLIC DEVELOPMENT OF METAL OXIDE BASED PHOTORESIST FOR ETCH STOP DETERRENCE

#2 | 2026-03-12
US20260072349A1
Physics

PHOTORESIST DEVELOPMENT WITH HALIDE CHEMISTRIES

#3 | 2026-02-05
US20260036908A1
Physics

INTEGRATION OF DRY DEVELOPMENT AND ETCH PROCESSES FOR EUV PATTERNING IN A SINGLE PROCESS CHAMBER

#4 | 2025-10-23
US20250328076A1
Physics

UNDERLAYER FOR PHOTORESIST ADHESION AND DOSE REDUCTION

#5 | 2025-09-18
US20250291255A1
Physics

INTEGRATION OF DRY DEVELOPMENT AND ETCH PROCESSES FOR EUV PATTERNING IN A SINGLE PROCESS CHAMBER

#6 | 2025-07-31
US20250244677A1
Physics

ALL-IN-ONE DRY DEVELOPMENT FOR METAL-CONTAINING PHOTORESIST

#7 | 2025-03-20
US20250093781A1
Physics

REWORK OF METAL-CONTAINING PHOTORESIST

#8 | 2025-02-20
US20250060674A1
Physics

ALL-IN-ONE DRY DEVELOPMENT FOR METAL-CONTAINING PHOTORESIST

#9 | 2024-12-26
US20240429045A1
Electricity

ATOMIC LAYER ETCH AND SELECTIVE DEPOSITION PROCESS FOR EXTREME ULTRAVIOLET LITHOGRAPHY RESIST IMPROVEMENT

#10 | 2024-12-19
US20240419078A1
Physics

PHOTORESIST DEVELOPMENT WITH HALIDE CHEMISTRIES

#11 | 2024-10-31
US20240361696A1
Physics

PHOTORESIST DEVELOPMENT WITH HALIDE CHEMISTRIES

#12 | 2024-10-03
US20240329539A1
Physics

MULTI-STEP POST-EXPOSURE TREATMENT TO IMPROVE DRY DEVELOPMENT PERFORMANCE OF METAL-CONTAINING RESIST

#13 | 2024-10-03
US20240329538A1
Physics

CYCLIC DEVELOPMENT OF METAL OXIDE BASED PHOTORESIST FOR ETCH STOP DETERRENCE

#14 | 2024-08-01
US20240255850A1
Physics

UNDERLAYER FOR PHOTORESIST ADHESION AND DOSE REDUCTION

#15 | 2024-06-13
US20240192590A1
Physics

APPARATUS AND PROCESS FOR EUV DRY RESIST SENSITIZATION BY GAS PHASE INFUSION OF A SENSITIZER

#16 | 2024-02-01
US20240036474A1
Physics

CONTROL OF METALLIC CONTAMINATION FROM METAL-CONTAINING PHOTORESIST

#17 | 2023-10-05
US20230314954A1
Physics

DRY BACKSIDE AND BEVEL EDGE CLEAN OF PHOTORESIST

#18 | 2023-07-20
US20230230811A1
Electricity

SURFACE MODIFICATION FOR METAL-CONTAINING PHOTORESIST DEPOSITION

#19 | 2023-02-02
US20230031955A1
Physics

POST APPLICATION/EXPOSURE TREATMENTS TO IMPROVE DRY DEVELOPMENT PERFORMANCE OF METAL-CONTAINING EUV RESIST

#20 | 2022-10-27
US20220344136A1
Electricity

DRY CHAMBER CLEAN OF PHOTORESIST FILMS

#21 | 2022-08-04
US20220244645A1
Physics

Photoresist development with halide chemistries

#22 | 2022-07-07
US20220216050A1
Electricity

Atomic layer etch and selective deposition process for extreme ultraviolet lithography resist improvement

#23 | 2022-04-21
US20220122848A1
Electricity

Selective etch using a sacrificial mask

#24 | 2022-02-10
US20220043334A1
Physics

Underlayer for photoresist adhesion and dose reduction

#25 | 2022-02-03
US20220035247A1
Physics

Underlayer for photoresist adhesion and dose reduction

InventorID:

5315642 ⎘