Tokyo
Japan
6
2024-07-11
The entities that hold a legal rights for patent applications filed by inventor Arima Eiji:
Eiji Arima from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT SUBSTRATE
#2 | 2024-04-25DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT SUBSTRATE
#3 | 2024-03-21DEFECT INSPECTION DEVICE
#4 | 2023-06-08DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
#5 | 2023-05-25Defect inspection device
#6 | 2022-03-10Defect inspection device and inspection method, and optical module
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