Weimar
Germany
17
2013-11-21
The entities that hold a legal rights for patent applications filed by inventor Hecht Frank:
Frank Hecht from Weimar, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Laser scanning microscope and its operating method
#2 | 2010-09-09Configuration of a laser scanning microscope for raster image correlation spectroscopy measurement and method for conducting and evaluating such a measurement
#3 | 2010-04-22Method and arrangement for controlled actuation of a microscope, in particular of a laser scanning microscope
#4 | 2009-12-03Laser scanning microscope and its operating method
#5 | 2008-03-20Method and arrangement for the controlled actuation of a microscope, in particular of a laser scanning microscope
#6 | 2008-02-28Procedure for the optical acquisition of objects by means of a light raster microscope
#7 | 2007-03-08Process for the acquisition of images from a probe with a light scanning electron microscope
#8 | 2006-12-07Laser scanning microscope
#9 | 2006-09-21Light scanning microscope and use
#10 | 2006-01-19Process for the acquisition of images from a probe with a light scanning electron microscope with punctiform light source distribution
#11 | 2006-01-19Process for the acquisition of images from a probe with a light scanning electron microscope with linear scanning
#12 | 2006-01-19Procedure for the optical acquisition of objects by means of a light raster microscope
#13 | 2006-01-19Process for the acquisition of images from a sample with a microscope
#14 | 2006-01-19Procedure for the optical acquisition of objects by means of a light raster microscope with line by line scanning
#15 | 2006-01-19Light scanning microscope and use
#16 | 2006-01-19Procedure for the optical acquisition of objects by means of a light raster microscope with punctual light source distribution
#17 | 2005-12-08Imaging fluorescence correlation spectroscopy for analysis of molecular interactions in low volumes
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