Stefan SCHULTE

City:

Stoedtlen

Country:

Germany

Published Applications:

Last publication date:

2024-02-01

Top Assignees for applications by Stefan SCHULTE

The entities that hold a legal rights for patent applications filed by inventor SCHULTE Stefan:

Stefan SCHULTE from Stoedtlen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

MEASUREMENT APPARATUS, METHOD FOR MEASURING BY INTERFEROMETRY, PROCESSING METHOD, OPTICAL ELEMENT AND LITHOGRAPHY SYSTEM

Method for calibrating a measuring apparatus

InventorID:

5435692 ⎘