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Inventor profile of:

Bart Buijsse

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2025-06-05

Top Assignees for applications by Bart Buijsse

The entities that hold a legal rights for patent applications filed by inventor Buijsse Bart:

FEI Company 39 Hillsboro, OR United States
Max-Planck-Gesellschaft zur Forderung der Wissenschaften E.V. 2 Munich, Germany
Max-Planck-Gesellschaft zur Gorderung der Wissenschaften e.V. 1 Munchen, Germany
Koninklijke Philips Electronics, N.V. 1 Eindhoven, Netherlands
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V. 1 , Germany
MAX-PLANCK-GESELLSCHAFT ZUR FÖRDERUNG DER WISSENSCHAFTEN E. V. 1 Munich, Germany
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e. V. 1 Munchen, Germany

Recent patent applications by Buijsse Bart

Bart Buijsse from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-06-05

US20250182997A1

Electricity

TRANSMISSION ELECTRON MICROSCOPE WITH VARIABLE EFFECTIVE FOCAL LENGTH

#2 | 2024-06-20

US20240203685A1

Electricity

POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST IN ELECTRON MICROSCOPE IMAGING

#3 | 2024-03-07

US20240077436A1

Physics

Methods and systems for determining the absolute structure of crystal

#4 | 2023-09-21

US20230298853A1

Electricity

Method and system for generating a diffraction image

#5 | 2023-01-19

US20230020957A1

Electricity

Method and system for generating a diffraction image

#6 | 2022-10-06

US20220317067A1

Physics

Method and system to determine crystal structure

#7 | 2022-10-06

US20220317066A1

Physics

Methods and systems for acquiring three-dimensional electron diffraction data

#8 | 2021-12-16

US20210391145A1

Electricity

Dual beam microscope system for imaging during sample processing

#9 | 2021-09-30

US20210305010A1

Electricity

Methods and systems for acquiring 3D diffraction data

#10 | 2020-12-24

US20200400594A1

Physics

Method and system for determining molecular structure

#11 | 2020-11-19

US20200365366A1

Electricity

Laser-based phase plate image contrast manipulation

#12 | 2020-05-07

US20200144022A1

Electricity

Diffraction pattern detection in a transmission charged particle microscope

#13 | 2019-02-21

US20190057836A1

Electricity

Diffraction pattern detection in a transmission charged particle microscope

#14 | 2018-04-12

US20180100815A1

Physics

Arrangement for X-Ray tomography

#15 | 2017-05-18

US20170138870A1

Physics

X-ray imaging technique

#16 | 2016-04-14

US20160104596A1

Electricity

Aligning a featureless thin film in a TEM

#17 | 2016-04-07

US20160096734A2

Chemistry; metallurgy

Method of Producing a Freestanding Thin Film of Nano-Crystalline Carbon

#18 | 2015-11-19

US20150332891A1

Electricity

User interface for an electron microscope

#19 | 2015-08-27

US20150243474A1

Electricity

Method of examining a sample in a charged-particle microscope

#20 | 2015-07-30

US20150214001A1

Electricity

Correlative optical and charged particle microscope

#21 | 2015-06-04

US20150151972A1

Chemistry; metallurgy

Method of producing a freestanding thin film of nano-crystalline graphite

#22 | 2014-11-06

US20140326878A1

Electricity

Phase shift method for a TEM

#23 | 2014-11-06

US20140326876A1

Electricity

Method of using a phase plate in a transmission electron microscope

#24 | 2014-07-24

US20140203191A1

Physics

Method of Observing Samples with a Fluorescent Microscope

#25 | 2014-03-06

US20140061463A1

Electricity

Imaging a sample in a TEM equipped with a phase plate

#26 | 2013-11-28

US20130313428A1

Electricity

Phase plate for a TEM

#27 | 2012-08-09

US20120199756A1

Electricity

Method for centering an optical element in a TEM comprising a contrast enhancing element

#28 | 2012-04-19

US20120091338A1

Electricity

Environmental cell for a particle-optical apparatus

#29 | 2011-12-29

US20110315876A1

Electricity

Blocking member for use in the diffraction plane of a TEM

#30 | 2011-06-09

US20110133083A1

Electricity

Compact scanning electron microscope

#31 | 2010-09-16

US20100230590A1

Electricity

Compact Scanning Electron Microscope

#32 | 2010-08-05

US20100194874A1

Electricity

User interface for an electron microscope

#33 | 2010-07-08

US20100171037A1

Electricity

Compact scanning electron microscope

#34 | 2009-10-01

US20090242763A1

Electricity

Environmental cell for a particle-optical apparatus

#35 | 2007-04-12

US20070080291A1

Electricity

Cluster tool for microscopic processing of samples

#36 | 2007-02-06

US9741672

X-ray microscope having an X-ray source for soft X-ray

#37 | 2006-12-21

US20060284108A1

Electricity

Apparatus for evacuating a sample

#38 | 2006-09-07

US20060197030A1

Electricity

Apparatus with permanent magnetic lenses

#39 | 2006-06-27

US10829002

Particle-optical apparatus with a permanent-magnetic lens and an electrostatic lens

#40 | 2006-05-11

US20060098188A1

Physics

Method of localizing fluorescent markers

#41 | 2005-10-27

US20050236568A1

Electricity

Apparatus with permanent magnetic lenses

#42 | 2005-03-31

US20050069082A1

Physics

Scanning x-ray microscope with a plurality of simultaneous x-ray probes on the sample

InventorID:

544092 ⎘