Kodai HATAKEYAMA

City:

Pijnacker

Country:

Netherlands

Published Applications:

Last publication date:

2024-12-12

Top Assignees for applications by Kodai HATAKEYAMA

The entities that hold a legal rights for patent applications filed by inventor HATAKEYAMA Kodai:

Kodai HATAKEYAMA from Pijnacker, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

METROLOGY DEVICE AND METHOD

Ultrasound sub-surface probe microscopy device and corresponding method

Heterodyne scanning probe microscopy method and scanning probe microscopy system

METHOD AND SYSTEM FOR IMAGING STRUCTURES BELOW THE SURFACE OF A SAMPLE

InventorID:

5451179 ⎘