Petaluma, California
United States
25
2025-12-04
The entities that hold a legal rights for patent applications filed by inventor Jungerman Roger L.:
Roger L. Jungerman from Petaluma, US has applied for patents for these inventions. The list has both pending applications and granted patents:
TRUST-ENABLED ARTIFICIAL INTELLIGENCE AND NON-HUMAN IDENTITY ORCHESTRATOR FRAMEWORK
#2 | 2024-07-18Configurable network security for networked energy resources, and associated systems and methods
#3 | 2024-05-02SECURE WIRELESS INDUSTRIAL MESH NETWORK
#4 | 2024-05-02Trusted software container management system
#5 | 2023-06-15Configurable network security for networked energy resources, and associated systems and methods
#6 | 2022-06-30SOLAR MODULE CARRIERS AND RELATED SYSTEMS
#7 | 2022-02-03Configurable network security for networked energy resources, and associated systems and methods
#8 | 2018-11-29DATA COMMUNICATION SYSTEM
#9 | 2017-03-16Solar module mounting
#10 | 2016-12-22PHOTOVOLTAIC MEASUREMENT SYSTEM
#11 | 2016-08-18SOLAR SYSTEM INSTALLATION
#12 | 2016-07-28Solar module carrier
#13 | 2015-04-02Predicting production of photovoltaic systems
#14 | 2014-03-13SOLAR MONITOR FOR SOLAR DEVICE
#15 | 2013-11-28SOLAR RESOURCE MEASUREMENT SYSTEM
#16 | 2011-11-10Solar monitor for solar device
#17 | 2009-02-05Method and apparatus for indicating the performance of a digital signal, based on a mapping of symbols extracted from the digital signal to one or more target symbol states
#18 | 2008-04-17Vector modulator calibration system
#19 | 2007-12-20Systems and methods for asynchronous triggering of an arbitrary waveform generator
#20 | 2007-03-22Advanced arbitrary waveform generator
#21 | 2006-11-23Frequency multiplied optical electronic oscillator
#22 | 2005-12-29Method of measuring jitter frequency response
#23 | 2005-11-03Method of phase shifting bits in a digital signal pattern
#24 | 2005-05-24Polarization-independent optical sampling with extended wavelength range
#25 | 2005-03-08Zero-crossing direction and time interval jitter measurement apparatus using offset sampling
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