Duane E. Meyer

City:

Bennet, Nebraska

Country:

United States

Published Applications:

Last publication date:

2022-08-04

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Duane E. Meyer from Bennet, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Reflectometer, spectrophotometer, ellipsometer and polarimeter systems including a wavelength modifier

InventorID:

5481259 ⎘