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Inventor profile of:

Akitoshi ICHIO

City:

Tokyo

Country:

Japan

Published Applications:

1

Last publication date:

2022-08-11

Recent patent applications by ICHIO Akitoshi

Akitoshi ICHIO from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-08-11

US20220254001A1

IMAGE MEASUREMENT METHOD AND IMAGE MEASUREMENT SYSTEM

InventorID:

5489560 ⎘