Jeff Sauer

City:

Danvers, Massachusetts

Country:

United States

Published Applications:

Last publication date:

2022-08-18

Top Assignees for applications by Jeff Sauer

The entities that hold a legal rights for patent applications filed by inventor Sauer Jeff:

Carl Zeiss SMT GmbH 1 Oberkochen, Germany

Recent patent applications by Sauer Jeff

Jeff Sauer from Danvers, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-08-18

US20220260508A1

Physics

System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles

InventorID:

5494621 ⎘