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Inventor profile of:

Wei Sun

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2025-01-02

Top Assignees for applications by Wei Sun

The entities that hold a legal rights for patent applications filed by inventor Sun Wei:

HITACHI HIGH-TECH CORPORATION 4 Tokyo, Japan
NEC Corporation 3 Tokyo, Japan
KOMATSU LTD. 1 Tokyo, Japan
NEC CORPORATION 1 Minato-ku, Tokyo, Japan
Hitachi High-Tech Corporation 1 Minato-ku, Tokyo, Japan
The University of Tokyo 1 Tokyo, Japan
Sony Corporation 1 Tokyo, Japan

Recent patent applications by Sun Wei

Wei Sun from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-01-02

US20250003898A1

Physics

FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM DEVICE

#2 | 2022-11-10

US20220359151A1

Electricity

Pattern inspecting device

#3 | 2022-07-21

US20220230842A1

Electricity

PATTERN MEASUREMENT SYSTEM AND PATTERN MEASUREMENT METHOD

#4 | 2021-07-22

US20210225608A1

Electricity

Electronic microscope device

#5 | 2019-05-16

US20190148108A1

Electricity

System and method for measuring patterns

#6 | 2018-03-22

US20180079361A1

Performing operations; transporting

Display system for work vehicle

#7 | 2015-10-15

US20150295854A1

Electricity

RESOURCE MANAGEMENT SYSTEM, RESOURCE MANAGEMENT METHOD AND PROGRAM

#8 | 2014-05-08

US20140129864A1

Physics

Multiprocessor system and method of saving energy therein

#9 | 2013-11-28

US20130318535A1

Physics

PRIMARY-BACKUP BASED FAULT TOLERANT METHOD FOR MULTIPROCESSOR SYSTEMS

#10 | 2012-11-29

US20120303998A1

Physics

Method, distributed system and computer program for failure recovery

#11 | 2012-04-19

US20120096466A1

Physics

METHOD, SYSTEM AND PROGRAM FOR DEADLINE CONSTRAINED TASK ADMISSION CONTROL AND SCHEDULING USING GENETIC APPROACH

#12 | 2006-02-09

US20060029369A1

Electricity

Recording control apparatus and method, and program

InventorID:

551365 ⎘