Maarten Bischoff

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2023-01-05

Top Assignees for applications by Maarten Bischoff

The entities that hold a legal rights for patent applications filed by inventor Bischoff Maarten:

Maarten Bischoff from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

METHOD AND SYSTEM FOR STUDYING SAMPLES USING A SCANNING TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH REDUCED BEAM INDUCED SAMPLE DAMAGE

InventorID:

5625398 ⎘