Patrick Wen

City:

Encinitas, California

Country:

United States

Published Applications:

Last publication date:

2026-05-21

Top Assignees for applications by Patrick Wen

The entities that hold a legal rights for patent applications filed by inventor Wen Patrick:

Patrick Wen from Encinitas, US has applied for patents for these inventions. The list has both pending applications and granted patents:

SPOT ERROR HANDLING FOR FOCUS TRACKING

SPOT ERROR HANDLING FOR FOCUS TRACKING

SEQUENCER FOCUS QUALITY METRICS AND FOCUS TRACKING FOR PERIODICALLY PATTERNED SURFACES

InventorID:

5691266 ⎘