Niskayuna, New York
United States
20
2025-05-22
The entities that hold a legal rights for patent applications filed by inventor Schmidt Daniel:
Daniel Schmidt from Niskayuna, US has applied for patents for these inventions. The list has both pending applications and granted patents:
OPTIMIZED INNER SPACER WITH BACKSIDE CONTACT
#2 | 2024-12-05FVBP WITHOUT BACKSIDE Si RECESS
#3 | 2024-09-26OPTIMAL SCANNER MAPS AND FIELD LAYOUTS
#4 | 2024-09-19ORDERED NANOTREES FOR SENSING APPLICATIONS
#5 | 2024-09-12STACKED UPPER TRANSISTOR AND LOWER TRANSISTOR
#6 | 2024-07-04HYBRID CMOS WITH FIN AND NANOSHEET ARCHITECTURES
#7 | 2024-06-13BACKSIDE POWER DISTRIBUTION NETWORK SUBSTRATE USING A LATTICE MATCHED ETCH STOP LAYER
#8 | 2024-06-06SEMICONDUCTOR DEVICE WITH VOID UNDER SOURCE/DRAIN REGION FOR BACKSIDE CONTACT
#9 | 2024-05-09Diffusion-break region in stacked-FET integrated circuit device
#10 | 2024-04-04EXTENDED EPITAXIAL GROWTH FOR IMPROVED CONTACT RESISTANCE
#11 | 2024-03-28LOCAL INTERCONNECT AT BACKSIDE TO ENABLE FLEXIBLE ROUTING ACROSS DIFFERENT CELL
#12 | 2024-03-28EPI GROWTH UNIFORMITY WITH SOURCE/DRAIN PLACEHOLDER
#13 | 2024-02-22BACKSIDE CONTACT FOR SEMICONDUCTOR DEVICE
#14 | 2024-01-25Source/drain epitaxy process in stacked FET
#15 | 2023-10-12PROFILE ENGINEERING FOR DEEP TRENCHES IN A SEMICONDUCTOR DEVICE
#16 | 2023-05-11High-density resistive random-access memory array with self-aligned bottom electrode contact
#17 | 2023-05-11FEED-FORWARD AND UTILIZATION OF HEIGHT INFORMATION FOR METROLOGY TOOLS
#18 | 2023-04-13CHARACTERIZATION OF ASYMMETRIC MATERIAL DEPOSITION FOR METROLOGY
#19 | 2023-03-30Metrology data correction
#20 | 2023-03-30Embedded memory pillar
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