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Inventor profile of:

Jongmin Yoon

City:

lncheon

Country:

Korea (South)

Published Applications:

1

Last publication date:

2023-06-29

Recent patent applications by Yoon Jongmin

Jongmin Yoon from lncheon, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2023-06-29

US20230204503A1

INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER

InventorID:

5784580 ⎘