Inventor profile of:

Thomas Schmid

City:

Aalen

Country:

Germany

Published Applications:

13

Last publication date:

2026-06-04

Top Assignees for applications by Thomas Schmid

The entities that hold a legal rights for patent applications filed by inventor Schmid Thomas:

Recent patent applications by Schmid Thomas

Thomas Schmid from Aalen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-06-04
US20260155329A1
Electricity

PARTICLE-OPTICAL ARRANGEMENT, FOR EXAMPLE MULTI-BEAM PARTICLE MICROSCOPE, WITH A MAGNET ARRANGEMENT FOR SEPARATING A PRIMARY AND A SECONDARY PARTICLE-OPTICAL BEAM PATH WITH IMPROVED PERFORMANCE

#2 | 2026-03-19
US20260081105A1
Electricity

MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST AUTOFOCUS AROUND AN ADJUSTABLE WORKING DISTANCE

#3 | 2025-12-04
US20250372343A1
Electricity

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ADAPTIVE DETECTION SYSTEM

#4 | 2025-11-13
US20250349500A1
Electricity

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH A DETECTION UNIT FOR FAST COMPENSATION OF CHARGING EFFECTS

#5 | 2025-11-13
US20250349497A1
Electricity

METHOD FOR DESIGNING A MULTI-BEAM PARTICLE BEAM SYSTEM HAVING MONOLITHIC PATH TRAJECTORY CORRECTION PLATES, COMPUTER PROGRAM PRODUCT AND MULTI-BEAM PARTICLE BEAM SYSTEM

#6 | 2025-11-06
US20250343025A1
Electricity

MULTI-BEAM PARTICLE MICROSCOPE WITH IMPROVED MULTI-BEAM GENERATOR FOR FIELD CURVATURE CORRECTION AND MULTI-BEAM GENERATOR

#7 | 2025-11-06
US20250343021A1
Electricity

FAST CLOSED-LOOP CONTROL OF MULTI-BEAM CHARGED PARTICLE SYSTEM

#8 | 2025-09-25
US20250299905A1
Electricity

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH DETECTION SYSTEM FOR FAST CHARGE COMPENSATION

#9 | 2025-06-26
US20250210300A1
Electricity

PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MICROSCOPE, WITH A MAGNET ARRANGEMENT FOR SEPARATING A PRIMARY AND A SECONDARY PARTICLE-OPTICAL BEAM PATH

#10 | 2025-04-24
US20250132124A1
Electricity

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH MIRROR FOR FIELD CURVATURE CORRECTION

#11 | 2024-05-23
US20240170252A1
Electricity

MULTI-BEAM GENERATING UNIT WITH INCREASED FOCUSING POWER

#12 | 2024-03-21
US20240096587A1
Electricity

DISTORTION OPTIMIZED MULTI-BEAM SCANNING SYSTEM

#13 | 2023-08-03
US20230245852A1
Electricity

MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST AUTOFOCUS AROUND AN ADJUSTABLE WORKING DISTANCE

InventorID:

5816984 ⎘