Shanghai
China
9
2022-06-02
The entities that hold a legal rights for patent applications filed by inventor Chen Hunglin:
Hunglin Chen from Shanghai, CN has applied for patents for these inventions. The list has both pending applications and granted patents:
Method and apparatus for predicting yield of semiconductor devices
#2 | 2015-01-01Method of inspecting misalignment of polysilicon gate
#3 | 2014-12-25Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor device
#4 | 2014-05-08Method of detecting the circular uniformity of the semiconductor circular contact holes
#5 | 2014-01-09Measurement of lateral diffusion of implanted ions in doped well region of semiconductor devices
#6 | 2013-12-26Method for monitoring alignment between contact holes and polycrystalline silicon gate
#7 | 2013-05-30SEMICONDUCTOR YIELD MANAGEMENT SYSTEM
#8 | 2013-05-30METHOD FOR MONITORING DEVICES IN SEMICONDUCTOR PROCESS
#9 | 2008-05-29Method for Preventing Wafer Edge Peeling in Metal Wiring Process
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