Hsin-Wei Wu

City:

Heverlee

Country:

Belgium

Published Applications:

Last publication date:

2025-04-03

Top Assignees for applications by Hsin-Wei Wu

The entities that hold a legal rights for patent applications filed by inventor Wu Hsin-Wei:

Hsin-Wei Wu from Heverlee, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

CONTOUR EXTRACTION OF IMAGES WITH SELECTION-BASED AUTO TUNING

WAFER IMAGE DEFECT DETECTION AND CHARACTERIZATION FOR MANUFACTURING PROCESS CALIBRATION

WAFER IMAGE DENOISING AND CONTOUR EXTRACTION FOR MANUFACTURING PROCESS CALIBRATION

InventorID:

5891032 ⎘